Universal B-H Curve Tracer

OBJECTIVE

1. Study of the hysteresis curves of transformer stampings, ferrites and other magnetic materials of different shapes and determination of their energy losses.

2. Study of the hysteresis curve as a function of the magnetic field.

3. Determination of saturation, magnetization, reminence and coercivity of magnetic materials.

Stefan's Constant Kit

OBJECTIVE: Sefan's constant by the black copper radiation plates (Electrical Method).

Curie Temperature Kit

Objective: MEASUREMENT of Dielectric Constant of Ferro-electric Samples at different temperature and hence determine Curie Temperature of Samples

Dielectric Constant Kit

Objective: DETERMINATION of DIELECTRIC CONSTANT of Solid Samples(Glass, Bakellie and PZT) by parallel plate capacitor.

B-H Curve Unit

Objective: Determination of Energy Band Gap of Silicon, Germanium etc using diodes and light emitting diodes.

Forbidden Energy Gap Kit

Objective: MEASUREMENT of Energy Band Gap of Semiconductors like Si, Ge etc using p-n junction diodes and LEDs

Fourier Analysis Kit

Objective: TO Analyze complex wave (square, clipped sine wave triangular wave etc.)
TO verify the existence of different harmonics and measure their relative amplitudes.

Lattice Dynamics Kit

Objective: 1. Study of the Dispersion relation for “Mono-atomic Lattice”. Determination of the Cut-off frequency and Comparison with theory.
2. Study of the Dispersion relation for the Di-atomic Lattice, Acoustical mode and Energy Gap. Comparison with theory.

Young's Modulus Apparatus

<p><strong>OBJECTIVE:</strong> DETERMINATION of Young&rsquo;s Modulus and Ultrasonic Velocity in solids like metals/quartz/glass</p>

Planck's Constant Kit

Objective:  MEASUREMENT of Planck’s Constant using LEDs.

Boltzman Constant Kit

Objective: MEASUREMENT of Boltzman’s Constant using semiconductor Diode.

Capacitance and Permittivity Kit

Objective: To Study - (1) Series and Parallel combination of capacitances.
(2) Factors that determine the capacitance of a parallel plate Capacitor ( area of overlap, distance between the plates and the medium )

Photodiode Characteristics Apparatus

Objective To Study I-V characteristics in reverse bias and to measure variation of photocurrent as a function of reverse voltage and intensity.

LED and Laser diode Characteristics Apparatus

Objective To Study I-V characteristics of LED and Diode Laser. To Study P-I characteristics of LED and Diode Laser.

Laser Experiment Kits

OBJECTIVE:

• Determination of Power distribution within beam.
• Measurement of beam spot size.
• Measurement of divergence of LASER beam.
• Determination of wavelength of LASER.
• Determination of grating element of reflection type grating.

Fiber Optic Apparatus

Objective To MEASURE Numerical Aperture and Acceptance angle of Optical Fiber.
To MEASURE attenuation in Optical Fiber.

Dielectric Constant Kit (FOR Liquid)

OBJECTIVE:: DETERMINATION OF DIELECTRIC CONSTANT of non- aquous Liquid Samples.